Total Absolute Measurement System (TAMS)

The Total Absolute Measurement system has the following specifications:

  • Fully automated goniometer design capable of measuring bi-directional reflectance and transmittance and angular resolved scattering
  • The accessory occupies the detector compartment only
  • Separate detectors for reference and sample beam, both can be exchanged by the operator for other detector modules that are optimized for different applications
  • Standard version equipped with sandwiched TE cooled Si/PbS detectors for the range 190 – 3,300 nm
  • Angular resolution 0.01° for both sample and detector stages
  • Angular accuracy 0.02° degrees for both sample and detector stages
  • Angular range sample stage +/- 180°
  • Angular range detector stage 15° - 345°
  • Angular range in reflectance 7.5° - >80°, depending on sample size
  • Angular range in transmittance 5° - >80°, depending on sample size (sample – detector inter-reflections occur for angles < 5 that compromises the accuracy)
  • Sample size up to 150 x 150 mm with the standard sample holder (200 mm x 180 mm with other means)
  • 200 mm Rotating sample platform with M5 screw holes on a 25mm x 25mm grid



  • Absolute measurement of directional Reflectance and transmittance
  • BRDF/ BTDF measurements

The detectors from the standard TAMS can be exchanged with sphere detector sets!



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