Optical Measurement and Testing solutions

Current news and events		Who we are		Current R&D projects
Mar 16, 2011 New tool for Scattering Ellipsometry Our latest development is a new attachment for our Automated Reflectance / Transmittance analyser (ARTA) which turns this versatile goniometer system into a Scattering Ellipsometer. The first unit with this option has been recently installed at the University of Toledo, Ohio in the US. It is intended to investigate the scattering behaviour of thin films like Transparent Conductive Oxides for Solar Cells. Mar 16, 2011 COSP2011 OMT Solutions will contribute to the Colloquium on Optical Spectrometry (COSP 2011) at BAM in Berlin, 21 - 22 March, with 2 oral and 4 poster presentations. More news and events		We are an R&D led technology company providing inovative solutions for optical measurement and testing problems and an extensive package of testing services and consultancy for the Optical industry Glass and coating industry Solar energy industry Universities and R&D institutes Our focus is on Optical Characterization of Materials. Our mission is to support the Industry and Scientific Community with world class innovative solutions for optical measurement and testing problems and new optical materials. Read more		Our R&D is currently directed to: Determining optical constants of thin films in the infrared Developing optical instruments for evaluating solar energy materials Developing Spectrophotometer Accessories Developing a new IR calibration facility for specular and diffuse samples Developing methods and tools for characterization of diffuse and patterned glazing samples Developing coatings and optical materials for space applications Our services and products are mostly about: optical characterisation, optical testing, product testing according to international standards, optical modelling, reflectance and transmittance spectrophotometry in the solar energy region and thermal infrared, scattering ellipsometry, thin film design, thin film analysis, measuring diffuse transmittance and reflectance, calibrated reference mirrors, etc.